Status of Production Boards
Last updated Jan. 20, 2000. Details on the tests named here can be found
at the here.
Board 1: OK. (Tested prior to Nov. 24.)
Board 2: OK. (Tested prior to Nov. 24.)
Board 3: OK. (Tested prior to Nov. 24.)
Jan. 20: Further 132ns tests passed: 2 loops each of CSTestAll1a through
CSTestAll1h (8 tests), and 2 loops each of CSTestAll2 through
CSTestAll7 (6 tests). Board also checked for proper handling of the
full FIFO condition. The board header word and module ID PROM
were verified for correctness.
Board 4: OK. (Tested prior to Nov. 24.)
Jan. 20: Further 132ns tests passed: 2 loops each of CSTestAll1a through
CSTestAll1h (8 tests), and 2 loops each of CSTestAll2 through
CSTestAll7 (6 tests). Board also checked for proper handling of the
full FIFO condition. The board header word and module ID PROM
were verified for correctness.
Board 5: OK.
Nov. 24: Good. Tests: CSTestAll2 through CSTestAll7 on blue.uchicago.edu
(6 tests * 8K-events * 10 loops, so approximately half a million
events). These tests involve DIRAC boards in all eight slots
serviced by CrateSum.
Jan. 20: Further 132ns tests passed: 2 loops each of CSTestAll1a through
CSTestAll1h (8 tests), and 2 loops each of CSTestAll2 through
CSTestAll7 (6 tests). Board also checked for proper handling of the
full FIFO condition. The board header word and module ID PROM
were verified for correctness.
Board 6: OK.
Nov. 24: Good. Tests: CSTestAll2 through CSTestAll7 on blue.uchicago.edu
(6 tests * 8K-events * 10 loops, so approximately half a million
events). These tests involve DIRAC boards in all eight slots
serviced by CrateSum.
Jan. 20: Further 132ns tests passed: 2 loops each of CSTestAll1a through
CSTestAll1h (8 tests), and 2 loops each of CSTestAll2 through
CSTestAll7 (6 tests). Board also checked for proper handling of the
full FIFO condition. The board header word and module ID PROM
were verified for correctness.
Board 7: OK.
Nov. 24: Good. Tests: CSTestAll2 through CSTestAll7 on blue.uchicago.edu
(6 tests * 8K-events * 10 loops, so approximately half a million
events). These tests involve DIRAC boards in all eight slots
serviced by CrateSum.
Jan. 20: Further 132ns tests passed: 2 loops each of CSTestAll1a through
CSTestAll1h (8 tests), and 2 loops each of CSTestAll2 through
CSTestAll7 (6 tests). Board also checked for proper handling of the
full FIFO condition. The board header word and module ID PROM
were verified for correctness.
Board 8: OK.
Nov. 24: This board has problems.
Soldier bridges between pins on the FIFO chips are
suspected. This matter will be investigated further on Monday. These
boards seem to be very dirty and there is a white residue on the legs
of many FIFO chips.
Nov. 30: The VME interface chip was reprogrammed. The board still fails,
although the errors are different now than those encountered on Nov.
24. Some solder paste was found on the back of the board and cleaned. Component U132, the 22ns delay line for the cdf_clock signal, was
replaced. The problem still persists.
Jan. 7, 2000: It has been found that for some reason, the cdf_132ns0
signal is not getting to the controller chip. This signal is valid
up to the very ball of the BGA chip, but the chip apparently does not
see it. An experiment was done in which this signal was rerouted to
a different input line; in this case, the board functions fine.
The board has been sent back to SMT for replacement of the
BGA chip and its return is expected within the next couple of weeks.
Jan. 18: SMT had sent the board out to another company for the replacement
of the BGA chip. The board clearly got the cdf_132ns0 signal.
After running the board tests, however, it was clear that the
front panel output for the trigger sum, bit 2 (counting from zero),
was always held high. Upon inspection of the appropriate LVDS chip,
it was clear that pins 9 and 10 on U23 were not soldered. After
soldering, the board was retested and passed all 132ns tests (i.e.
CSTestAll2 through CSTestAll7, 10 loops each).
Jan. 20: Further 132ns tests passed: 2 loops each of CSTestAll1a through
CSTestAll1h (8 tests), and 2 loops each of CSTestAll2 through
CSTestAll7 (6 tests). Board also checked for proper handling of the
full FIFO condition. The board header word and module ID PROM
were verified for correctness.
Board 9: OK.
Nov. 24: This board has problems.
Soldier bridges between pins on the FIFO chips are
suspected. This matter will be investigated further on Monday. These
boards seem to be very dirty and there is a white residue on the legs
of many FIFO chips.
Nov. 30: The delay line chips' legs were retouched, since some had not been
soldered. There were still problems afterwards. A piece of wire was
found to be shorting pins 17 and 18 of RC3. These lines correspond to
VME data lines, bits 0 and 7. The wire was removed and the board
passed all tests CSTestAll2 through CSTestAll7, 10 loops each.
Jan. 20: Further 132ns tests passed: 2 loops each of CSTestAll1a through
CSTestAll1h (8 tests), and 2 loops each of CSTestAll2 through
CSTestAll7 (6 tests). Board also checked for proper handling of the
full FIFO condition. The board header word and module ID PROM
were verified for correctness.
Board 10: OK.
Nov. 24: This board has problems.
Soldier bridges between pins on the FIFO chips are
suspected. This matter will be investigated further on Monday. These
boards seem to be very dirty and there is a white residue on the legs
of many FIFO chips.
Nov. 29: The delay line pins were retouched. Some of them were clearly
not soldered to the pad. The board now works.
Jan. 20: Further 132ns tests passed: 2 loops each of CSTestAll1a through
CSTestAll1h (8 tests), and 2 loops each of CSTestAll2 through
CSTestAll7 (6 tests). Board also checked for proper handling of the
full FIFO condition. The board header word and module ID PROM
were verified for correctness.
Board 11: OK.
Nov. 30: The VME interface chip was reprogrammed.
Jan. 6, 2000: This board had been failing CSTestAll2 and CSTestAll3 while
passing CSTestAll4 through CSTestAll7. Trigger bit 8 (counting from 0)
of the single-bit trigger
bits was, at some specific times, not going to a "1" state.
The problem turns out to be that pin 19 of the data latch chip U55 was
unsoldered. After soldering, the board passes all tests
CSTestAll2 through CSTestAll7.
Jan. 20: Further 132ns tests passed: 2 loops each of CSTestAll1a through
CSTestAll1h (8 tests), and 2 loops each of CSTestAll2 through
CSTestAll7 (6 tests). Board also checked for proper handling of the
full FIFO condition. The board header word and module ID PROM
were verified for correctness.
Board 12: OK.
Nov. 24: Good. Tests: CSTestAll2 through CSTestAll7 on blue.uchicago.edu
(6 tests * 8K-events * 10 loops, so approximately half a million
events). These tests involve DIRAC boards in all eight slots
serviced by CrateSum.
Jan. 20: Further 132ns tests passed: 2 loops each of CSTestAll1a through
CSTestAll1h (8 tests), and 2 loops each of CSTestAll2 through
CSTestAll7 (6 tests). Board also checked for proper handling of the
full FIFO condition. The board header word and module ID PROM
were verified for correctness.
Board 13: OK.
Nov. 24: This board has problems.
Soldier bridges between pins on the FIFO chips are
suspected. This matter will be investigated further on Monday. These
boards seem to be very dirty and there is a white residue on the legs
of many FIFO chips.
Nov. 29: The delay line pins were retouched. Some of them were clearly
not soldered to the pad. The board now works.
Jan. 20: Further 132ns tests passed: 2 loops each of CSTestAll1a through
CSTestAll1h (8 tests), and 2 loops each of CSTestAll2 through
CSTestAll7 (6 tests). Board also checked for proper handling of the
full FIFO condition. The board header word and module ID PROM
were verified for correctness.
Board 14: OK.
Nov. 24: Good. Tests: CSTestAll2 through CSTestAll7 on blue.uchicago.edu
(6 tests * 8K-events * 10 loops, so approximately half a million
events). These tests involve DIRAC boards in all eight slots
serviced by CrateSum.
Jan. 20: Further 132ns tests passed: 2 loops each of CSTestAll1a through
CSTestAll1h (8 tests), and 2 loops each of CSTestAll2 through
CSTestAll7 (6 tests). Board also checked for proper handling of the
full FIFO condition. The board header word and module ID PROM
were verified for correctness.
Board 15: OK.
Nov. 24: Good. Tests: CSTestAll2 through CSTestAll7 on blue.uchicago.edu
(6 tests * 8K-events * 10 loops, so approximately half a million
events). These tests involve DIRAC boards in all eight slots
serviced by CrateSum.
Jan. 20: Further 132ns tests passed: 2 loops each of CSTestAll1a through
CSTestAll1h (8 tests), and 2 loops each of CSTestAll2 through
CSTestAll7 (6 tests). Board also checked for proper handling of the
full FIFO condition. The board header word and module ID PROM
were verified for correctness.
Board 16: Needs work.
Nov. 24: This board clearly has pins that were not soldered by SMT.
These pins were left unsoldered,
since the plan was to see how its siblings do on the tests. If these
boards need to be sent back for reworking, then this present board
can be sent as well.
Nov. 30: The VME interface chip was programmed or possibly reprogrammed.
The unsoldered pins were soldered and the front panel put on the
board. A mounting block is missing from the front panel,
so extra care should be
exercised while inserting or extracting the board in the crate.
The board does not work upon testing.
Jan. 6, 2000: Board passes tests CSTestAll2 through CSTestAll7 with 10
loops each test.
Jan. 20: Further 132ns tests passed: 2 loops each of CSTestAll1a through
CSTestAll1h EXCEPT FOR CSTestAll1d (7 tests passed, 1 test failed).
2 loops each of CSTestAll2 through CSTestAll7 (6 tests) passed.
Board also checked for proper handling of the
full FIFO condition. The board header word and module ID PROM
were verified for correctness.
Comments
Nov. 24:
The webbing on the front panel of the Level 1 boards, the purpose of
which is
to provide good grounding for the boards, may cause problems.
They are likely to come loose and get shoved
behind the front panel, thus potentially grounding pins on the back
of the neighboring board to the right. There is no way, no matter how
carefully one inserts the boards, to get around this problem once the
webbing starts to lift away from the right edge of the front panel.
I think this is a very serious problem that needs to be addressed.
Note (Dec. 1999): Peter Wilson has cleared all L1 boards for
removal of the front panel webbing.
Jan. 7:
All boards, with the exception of Boards 1 and 2 at B0, are stored
in the temporary storage crate on the shelf in the
Chicago e-shop teststand room.
Before the boards are all officially released, I have to run some further
tests of the boards to check the module ID prom, the board header word,
etc. The board serial numbers of the boards, controlled by DIP
switches, also will have to be epoxied.
Jan. 18:
Boards in the temporary storage crate in the chicago e-shop teststand room
have had their DIP switches epoxied. All boards have had their
front panel webbing removed.
Jan. 20:
Boards 5 and 8 have been tested with the CSTestAll1a through
CSTestAll1h tests. The tests CSTestAll2 through CSTestAll7 have
been repeated for these boards as well. In addition, proper handling
of the full FIFO condition was checked. The board header and ID PROM
words were verified.
Boards 4 through 15 (12 boards) are fully tested, packed, and ready to
make the journey to Fermilab. The two boards (Boards 1 and 2)
currently at B0 will
return to Chicago for further testing and work.
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main CrateSum page.
This page is maintained by
Nancy J. Lai.
Email me at
nlai@cdf.uchicago.edu if you
have any questions or comments.