Phone number: +1 510 665 5437
Meeting ID: 3281 <-- NOTE DIFFERENT NUMBER
Meeting start time: 2 PM Chicago Time (can call in anytime after 12:45 PM)

• EFI/EDG Chicago
• Mircea Bogdan
• Henry Frisch
• Jean-François Genat
• Herve Grabas
• Mary Heintz
• Eric Oberla
• University of Hawaii
• Gary Varner, reviewer
• Argonne National Laboratory
• Gary Drake, reviewer
• Laboratoire de Physique Corpusculaire at Clermont-Ferrand, France
• Jacques Lecoq, reviewer

• Sampling Chip Context
  Sampling Chip V3 pdf pptx
  Numbers 1 pdf pptx
  Jean-François Genat, Henry Frisch
• Design Kits, Libraries
  Software in Use
  Mary Heintz
• Chip 2 Test Results
  Psec2 Tests pdf
  Eric Oberla
• From Chip 2 to Chip 3
  Sampling Chip V2 pdf
  Chip2 to Chip 3 pdf pptx
  Eric Oberla, Hervé Grabas, Jean-François Genat
• Chip 3 Design
  Sampling Chip V2 pdf
  Sampling Chip V3 pdf docx
  Sampling Chip 3 block 1 png
  
  Eric Oberla, Hervé Grabas, Jean-François Genat
• Chip 3 Pinout
  Sampling Chip V3 pdf docx
  
  Eric Oberla, Hervé Grabas, Jean-François Genat
• Building Blocks
  • Sampling Cell and Dynamics Range and Analog Bandwidth
    Sampling Cell, Dynamic Rand and Bandwidth pdf
    Fast Buffer pdf
    Hervé Grabas
  • ADC, Precision and Conversion Rate
    ADC Psec3 pdf
    Eric Oberla
  • New Comparator Design, Speed and Accuracy
    Comparator 1 & 2 and Ramp Buffer pdf
    Hervé Grabas
  • Trigger
    Trigger PSEC3 pdf
    Eric Oberla, Hervé Grabas
  • Readout
    Readout PSEC3 pdf
    Eric Oberla
• Test Structures
  
  Eric Obera, Hervé Grabas
• I/O Pads
  IO Pads pdf
  Hervé Grabas
• Test Benches
  Flip Card pdf
  Mircea Bogdan
• Discussion
  
  All
• AOB
  

• IBM 130nm CMOS Process
• Full Schematics
• Schematics
• 3-bit Decoder
• and3
• ro_fanbuf
• 5-input OR
• Channel PSEC3
• ADC store
• ADC64
• ADC16
• ADC memcell4
• ADC Store Cell
• 12bit Wilkstore
• DFF Store Edge
• DFF Store
• Latch EN
• D Flip Flop
• Latch
• DFF Store Edge
• BITout buf
• Dig Buf
• Dig Buff
• RO Fan
• Ringosc
• D Flip Flop
• Dig Mux2
• RO Fanout Fan
• Dig Buf
• RO Fan Buf
• Analog 256
• Analog Unit Mux
• Analog Unit
• Comparator2 V4
• Sampling Cell V4
• Small Buffer V4
• Big Buffer Curr V4
• Big Buffer V4
• Current Source V4
• Trig
• DFF Store Edge
• D Flip Flop
• DFF Store
• Latch EN
• Latch
• Dig Buf
• Dig Mux2
• Counter 12
• D Flip Flop
• Test ADC Structures
• ADC Store Cell Test Struct
• 12-bit Wilkstore
• DFF Store Edge
• D Flip Flop
• Latch
• DFF Store Edge
• D Flip Flop
• DFF Store
• Latch EN
• Latch
• Counter 12
• D Flip Flop
• Dig Buf
• Dig Mux2
• Ringosc
• D Flip Flop
• Dig Mux2
• RO Fan Buf
• Test Structures
• ADC Store Cell Teststruct
• 12bit Wilkstore Test
• DFF Store
• DFF Store Edge
• DFF Store
• Latch EN
• Counter 12
• Ringosc
• RO Fanbuf
• Token Read
• Dig Buff
• Tok 64 Final
• D Flip Flop
• Dig Buff
• Tok 64
• Tok 8
• Tok Unit
D Flip Flop
• 13 Drivers
• RAMP
• VCDL and DLL
• DLL Control Unit
• DLL Logic Ctrl N
• Big Delay
• Big Inverter
• D Flip Flop
• Inverter Cell
• Nor Cell
• DLL Logic Ctrl P
• Big Delay
• Big Inverter
• D Flip Flop
• Inverter Cell
• Nor Cell
• Phase Detector and Charge Pump N
• Phase Detector and Charge Pump P
• Timing Gen